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Applied Optics

Applied Optics


  • Vol. 24, Iss. 24 — Dec. 15, 1985
  • pp: 4404–4407

Study of refractive index of GeO2:SiO2 mixtures using deposited-thin-film optical waveguides

Agnes S. Huang, Yehuda Arie, Clyde C. Neil, and Jacob M. Hammer  »View Author Affiliations

Applied Optics, Vol. 24, Issue 24, pp. 4404-4407 (1985)

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Refractive indices of deposited thin films of amorphous GeO2:SiO2 mixtures were determined by multimode optical waveguide measurement techniques at four different wavelengths and used to characterize waveguide properties as a function of material composition. The results indicate that the refractive index varies linearly with the mole fraction of GeO2 in the guide, while wavelength dispersion increases with heavier GeO2 dopant concentrations. This is consistent with previously reported findings for bulk samples and suggests that linear variation of the film’s compositional content is a viable method for obtaining refractive indices and dispersive properties needed to interface with other optical devices in integrated optics-type applications.

© 1985 Optical Society of America

Original Manuscript: May 25, 1985
Published: December 15, 1985

Agnes S. Huang, Yehuda Arie, Clyde C. Neil, and Jacob M. Hammer, "Study of refractive index of GeO2:SiO2 mixtures using deposited-thin-film optical waveguides," Appl. Opt. 24, 4404-4407 (1985)

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