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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 24, Iss. 24 — Dec. 15, 1985
  • pp: 4404–4407

Study of refractive index of GeO2:SiO2 mixtures using deposited-thin-film optical waveguides

Agnes S. Huang, Yehuda Arie, Clyde C. Neil, and Jacob M. Hammer  »View Author Affiliations


Applied Optics, Vol. 24, Issue 24, pp. 4404-4407 (1985)
http://dx.doi.org/10.1364/AO.24.004404


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Abstract

Refractive indices of deposited thin films of amorphous GeO2:SiO2 mixtures were determined by multimode optical waveguide measurement techniques at four different wavelengths and used to characterize waveguide properties as a function of material composition. The results indicate that the refractive index varies linearly with the mole fraction of GeO2 in the guide, while wavelength dispersion increases with heavier GeO2 dopant concentrations. This is consistent with previously reported findings for bulk samples and suggests that linear variation of the film’s compositional content is a viable method for obtaining refractive indices and dispersive properties needed to interface with other optical devices in integrated optics-type applications.

© 1985 Optical Society of America

History
Original Manuscript: May 25, 1985
Published: December 15, 1985

Citation
Agnes S. Huang, Yehuda Arie, Clyde C. Neil, and Jacob M. Hammer, "Study of refractive index of GeO2:SiO2 mixtures using deposited-thin-film optical waveguides," Appl. Opt. 24, 4404-4407 (1985)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-24-24-4404


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References

  1. S. Y. Yin, B. K. Garside, “Low Loss GeO2 Optical Waveguide Fabrication Using Low Deposition Rate rf Sputtering,” Appl. Opt. 21, 4324 (1982). [CrossRef] [PubMed]
  2. G. G. Devyatykh et al., “Material Dispersion and Rayleigh Scattering in Glassy Germanium Dioxide, a Substance with Promising Applications in Low-Loss Optical Fiber waveguides,” Sov. J. Quantum Electron. 10, 900 (1980). [CrossRef]
  3. S. Kobayashi, S. Shibata, N. Shibata, T. Izawa, “Refractive-Index Dispersion of Doped Fused Silica,” in Technical Digest, First International Conference on Integrated Optics and Optical Fiber Communication (IECE, Tokyo, 1977).
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  5. E. M. Dianov, “Prospects for the Use of the 1–1.6-μ Wavelength Range in Fiber Optic Communications (Review),” Sov. J. Quantum Electron. 10, 259 (1980). [CrossRef]
  6. M. J. Adams, D. N. Payne, F. M. E. S. Aden, A. H. Hartog, “Wavelength-Dispersive Properties of Glasses for Optical Fibres: the Germania Enigma,” Electron. Lett. 14, 703 (1978). [CrossRef]
  7. P. K. Tien, R. Ulrich, R. J. Martin, “Modes of Propagating Lightwaves in Thin Deposited Semiconductor Films,” Appl. Phys. Lett. 14, 291 (1969). [CrossRef]
  8. F. Zernike, “Fabrication And Measurement Of Passive Components,” Integrated Optics, T. Tamir, Ed. (Springer-Verlag, Berlin, 1979).
  9. H. Kogelnik, “Theory Of Dielectric Waveguides,” in Integrated Optics, T. Tamir, Ed. (Springer-Verlag, Berlin, 1979).
  10. J. M. Hammer, “An Optical Waveguide Method of Measuring Refractive Index and Thicknesses Of Thin Films,” unpublished.
  11. J. W. Fleming, “Dispersion in GeO2–SiO2 Glasses,” Appl. Opt. 24, 4486 (1984). [CrossRef]
  12. I. H. Malitson, “Refractive Index of Fused Silica,” J. Opt. Soc. Am. 55, 1205 (1965). [CrossRef]

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