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Applied Optics

Applied Optics


  • Vol. 24, Iss. 24 — Dec. 15, 1985
  • pp: 4454–4459

Total refraction at oblique incidence by a transparent bilayer coating on a high-index transparent or absorbing substrate

R. M. A. Azzam and Karim Javily  »View Author Affiliations

Applied Optics, Vol. 24, Issue 24, pp. 4454-4459 (1985)

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Transparent bilayer coatings that produce total refraction (TR) of obliquely incident monochromatic light into an underlying substrate are considered. When the substrate is transparent, it is shown that TR takes place without any accompanying change of polarization. Totally refracting bilayers are realizable in the IR where high-refractive-index substrates are available. This is illustrated by a BaF2–ZnSe bilayer on a Ge substrate at a 10.6-μm (CO2 laser) wavelength and 45° angle of incidence. Limited changes of the angle of incidence, wavelength, and refractive indices and thicknesses of the two films of the bilayer are introduced, and their effects on the condition of TR are determined. TR (hence absorption) is also possible for absorbing (semiconductor or metallic) substrates using transparent bilayers of films of nonquarter-wave optical thickness, as is further demonstrated in this paper.

© 1985 Optical Society of America

Original Manuscript: July 12, 1985
Published: December 15, 1985

R. M. A. Azzam and Karim Javily, "Total refraction at oblique incidence by a transparent bilayer coating on a high-index transparent or absorbing substrate," Appl. Opt. 24, 4454-4459 (1985)

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  1. See, for example, R. M. A. Azzam, “Single-Layer Antireflection Coatings on Absorbing Substrates for the Parallel and Perpendicular Polarizations at Oblique Incidence,” Appl. Opt. 24, 513 (1985). [CrossRef] [PubMed]
  2. H. Pohlack, “Zum Problem der Reflexionsminderung Optischer Glaser bei Nichtsenkrechtem Lichteinfall,” in Jenaer Jahrbuch 1952, P. Gorlich, Ed. (Fischer, Jena, 1952), pp. 103–118.
  3. K. Javily, R. M. A. Azzam, “Coating a Transparent or Absorbing Substrate by a Transparent Thin Film for Minimum Reflectance of Unpolarized Light at Oblique Incidence,” Optik, in press.
  4. P. Baumeister, “The Transmission and Degree of Polarization of Quarter-Wave Stacks at Non-Normal Incidence,” Opt. Acta 8, 105 (1961). [CrossRef]
  5. R. M. A. Azzam, K. Javily, “Antireflecting and Polarizing Transparent Bilayer Coatings on Absorbing Substrates at Oblique Incidence,” Appl. Opt. 24, 519 (1985). [CrossRef] [PubMed]
  6. See, for example, R. M. A. Azzam, N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977); Eq. (4.186) must be corrected to have the same denominator as Eq. (4.185). This correction follows because S21 should be replaced by S11 in Eq. (4.170).
  7. M. Herzberger, C. D. Salzberg, “Refractive Indices of Infrared Optical Materials and Color Correction of Infrared Lenses,” J. Opt. Soc. Am. 52, 420 (1962). [CrossRef]
  8. P. C. Kemeny, “Refractive Index of Thin Films of Barium Fluoride,” Appl. Opt. 21, 2052 (1982). [CrossRef] [PubMed]
  9. M. E. Pedinoff, M. Braunstein, O. M. Stafsudd, “Refractive Indices of Materials: 10.6-μm Ellipsometer Measurements,” Appl. Opt. 16, 2849 (1977). [CrossRef] [PubMed]
  10. M. A. Ordal, L. L. Long, R. J. Bell, J. E. Bell, R. R. Bell, R. W. Alexander, C. A. Ward, “Optical Properties of the Metals Al, Co, Cu, Au, Fe, Pb, Ni, Pd, Pt, Ag, and W in the Infrared and Far Infrared,” Appl. Opt. 22, 1099 (1983). [CrossRef] [PubMed]
  11. D. E. Aspnes, A. A. Studna, “Dielectric Functions and Optical Parameters of Si, Ge, GaP, GaSb, InP, InAs, and InSb from 1.5 to 6.0eV,” Phys. Rev. B 27, 985 (1983). [CrossRef]
  12. H. K. Pulker, “Characterization of Optical Thin Films,” Appl. Opt. 18, 1969 (1979). [CrossRef] [PubMed]
  13. H. K. Pulker, G. Paesold, E. Ritter, “Refractive Indices of TiO2 Films Produced by Reactive Evaporation of Various Titanium-Oxygen Phases,” Appl. Opt. 15, 2987 (1976). [CrossRef]

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