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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 24, Iss. 8 — Apr. 15, 1985
  • pp: 1183–1188

Quarterwave layers: simulation by three thin layers of two materials

R. Herrmann  »View Author Affiliations


Applied Optics, Vol. 24, Issue 8, pp. 1183-1188 (1985)
http://dx.doi.org/10.1364/AO.24.001183


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Abstract

The simulation of a homogeneous quarterwave layer by a thin-film assembly requires that the complex amplitude reflections of both layer systems have to coincide at the design wavelength. Since the complex amplitude reflection consists of a real and an imaginary part (magnitude and phase), this requirement leads to two conditions for the simulating film assembly. The addition of a third condition, namely, the coincidence of the slopes of the magnitude curves at the design wavelength, yields a good approximation of the complex amplitude reflection of the homogeneous quarterwave layer over a broad wavelength range and is, therefore, called a wideband simulation. The three conditions for the wideband simulation can be fulfilled by three independent parameters. These can be the layer thicknesses of a three-layer system consisting of two materials.

© 1985 Optical Society of America

History
Original Manuscript: November 29, 1984
Published: April 15, 1985

Citation
R. Herrmann, "Quarterwave layers: simulation by three thin layers of two materials," Appl. Opt. 24, 1183-1188 (1985)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-24-8-1183

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