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Applied Optics

Applied Optics


  • Vol. 25, Iss. 10 — May. 15, 1986
  • pp: 1653–1660

Fringe-pattern analysis using a 2-D Fourier transform

Donald J. Bone, H.-A. Bachor, and R. John Sandeman  »View Author Affiliations

Applied Optics, Vol. 25, Issue 10, pp. 1653-1660 (1986)

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A refinement of the Fourier transform fringe-pattern analysis technique which uses a 2-D Fourier transform is described. The 2-D transform permits better separation of the desired information components from unwanted components than a 1-D transform. The accuracy of the technique when applied to real data recorded by a system with a nonlinear response function is investigated. This leads to simple techniques for optimizing an interferogram for analysis by these Fourier transform methods and to an estimate of the error in the retrieved fringe shifts. This estimate is tested on simulated data and found to be reliable.

© 1986 Optical Society of America

Original Manuscript: September 6, 1985
Published: May 15, 1986

Donald J. Bone, H.-A. Bachor, and R. John Sandeman, "Fringe-pattern analysis using a 2-D Fourier transform," Appl. Opt. 25, 1653-1660 (1986)

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  1. M. Takeda, H. Ina, S. Kobayashi, “Fourier-Transform Method of Fringe-Pattern Analysis for Computer-Based Topography and Interferometry,” J. Opt. Soc. Am. 72, 156 (1981). [CrossRef]
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