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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 25, Iss. 12 — Jun. 15, 1986
  • pp: 1879–1879

Study of refractive index of GeO2:SiO2 mixtures using deposited-thin-film optical waveguides: erratum

Agnes S. Huang, Yehuda Arie, Clyde C. Neil, and Jacob M. Hammer  »View Author Affiliations


Applied Optics, Vol. 25, Issue 12, pp. 1879-1879 (1986)
http://dx.doi.org/10.1364/AO.25.001879


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No abstract available.

History
Original Manuscript: January 31, 1986
Published: June 15, 1986

Citation
Agnes S. Huang, Yehuda Arie, Clyde C. Neil, and Jacob M. Hammer, "Study of refractive index of GeO2:SiO2 mixtures using deposited-thin-film optical waveguides: erratum," Appl. Opt. 25, 1879-1879 (1986)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-25-12-1879

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