OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 25, Iss. 12 — Jun. 15, 1986
  • pp: 1890–1900

Near-field diffraction by a slit: implications for superresolution microscopy

Eric Betzig, A. Harootunian, A. Lewis, and M. Isaacson  »View Author Affiliations


Applied Optics, Vol. 25, Issue 12, pp. 1890-1900 (1986)
http://dx.doi.org/10.1364/AO.25.001890


View Full Text Article

Enhanced HTML    Acrobat PDF (1353 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

The transmission of light through an infinite slit in a thick perfectly conducting screen is investigated. The spatial distribution of the near-field energy flux is determined through the formulation of four coupled integral equations, which are solved numerically. Transmission coefficients calculated by this method are in agreement with those determined by an alternative formulation. The results theoretically demonstrate the feasibility of near-field superresolution microscopy, in which the collimated radiation passed by an aperture is used to circumvent the diffraction limit of conventional optics, and further suggest the feasibility of near-field superresolution acoustic imaging.

© 1986 Optical Society of America

History
Original Manuscript: December 23, 1985
Published: June 15, 1986

Citation
Eric Betzig, A. Harootunian, A. Lewis, and M. Isaacson, "Near-field diffraction by a slit: implications for superresolution microscopy," Appl. Opt. 25, 1890-1900 (1986)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-25-12-1890


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. H. A. Bethe, “Theory of Diffraction by Small Holes,” Phys. Rev. 66, 163 (1944). [CrossRef]
  2. C. M. Butler, Y. Rahmat-Samii, R. Mittra, “Electromagnetic Penetration Through Apertures in Conducting Surfaces,” IEEE Trans. Antennas Propag. AP-26, 82 (1978). [CrossRef]
  3. E. A. Ash, G. Nicholls, “Super-Resolution Aperture Scanning Microscope,” Nature London 237, 510 (1972). [CrossRef] [PubMed]
  4. R. F. Harrington, D. T. Auckland, “Electromagnetic Transmission Through Narrow Slots in Thick Conducting Screens,” IEEE Trans. Antennas Propag. AP-28, 616 (1980). [CrossRef]
  5. F. L. Neerhoff, G. Mur, “Diffraction by a Slit in a Thick Screen,” Appl. Sci. Res. 28, 73 (1973).
  6. P. M. Morse, H. Feshbach, Methods of Theoretical Physics (McGraw-Hill, New York, 1953), pp. 812–818.
  7. M. Abramowitz, I. A. Stegun, Handbook of Mathematical Functions (Dover, New York, 1970), pp. 480, 496.
  8. G. Binnig, H. Rohrer, “Scanning Tunneling Microscopy,” Helv. Phys. Acta 55, 726 (1982).
  9. J. R. Matey, J. Blanc, “Scanning Capacitance Microscopy,” J. Appl. Phys. 57, 1437 (1985). [CrossRef]
  10. A. Lewis, M. Isaacson, A. Harootunian, A. Muray, “Development of a 500 Å Spatial Resolution Light Microscope,” Ultramicroscopy 13, 227 (1984). [CrossRef]
  11. E. Betzig, A. Lewis, A. Harootunian, M. Isaacson, E. Kratschmer, “Near-Field Scanning Optical Microscopy (NSOM): Development and Biophysical Applications,” Biophys. J. 49, 269 (1986). [CrossRef] [PubMed]
  12. U. Ch. Fischer, “Optical Characteristics of 0.1 μm Circular Apertures in a Metal Film as Light Sources for Scanning Ultramicroscopy,” J. Vac. Sci. Technol. B3, 386 (1985).
  13. D. W. Pohl, W. Denk, M. Lanz, “Optical Stethoscopy: Image Recording With Resolution λ/20,” Appl. Phys. Lett. 44, 652 (1984). [CrossRef]
  14. G. A. Massey, J. A. Davis, S. M. Katnik, E. Omon, “Subwavelength Resolution Far-Infrared Microscopy,” Appl. Opt. 24, 1498 (1985). [CrossRef] [PubMed]
  15. A. Barraud, “Polymerization in Langmuir-Blodgett Films and Resist Applications,” Thin Solid Films 99, 317 (1983). [CrossRef]
  16. U. Ch. Fischer, H. P. Zingsheim, “Submicroscopic Pattern Replication With Visible Light,” J. Vac. Sci. Technol. 19, 881 (1981). [CrossRef]
  17. K. L. Tai, R. G. Vadimsky, C. T. Kemmerer, J. S. Wagner, V. E. Lamberte, A. G. Timko, “Submicron Optical Lithography Using an Inorganic Resist/Polymer Bilevel Scheme,” J. Vac. Sci. Technol. 17(5), 1169 (1980). [CrossRef]
  18. B. Hadimioglu, C. F. Quate, “Water Acoustic Microscopy at Suboptical Wavelengths,” Appl. Phys. Lett. 43, 1006 (1983). [CrossRef]
  19. J. W. Weaver, C. Krafka, D. W. Lynch, E. E. Koch, “Optical Properties of Metals,” Phys. Daten 18-2, 74 (1981).
  20. G. A. Massey, “Microscopy and Pattern Generation With Scanned Evanescent Waves,” Appl. Opt. 23, 658 (1984). [CrossRef] [PubMed]
  21. Y. Leviatan, Israel Institute of Technology; private communication.
  22. N. A. McDonald, “Electric and Magnetic Coupling through Small Apertures in Shield Walls of Any Thickness,” IEEE Trans. Microwave Theory Tech. MTT-20, 689 (1972). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited