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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 25, Iss. 16 — Aug. 15, 1986
  • pp: 2757–2763

Optimization of layered synthetic microstructures for narrowband reflectivity at soft x-ray and EUV wavelengths

John F. Meekins, Raymond G. Cruddace, and Herbert Gursky  »View Author Affiliations


Applied Optics, Vol. 25, Issue 16, pp. 2757-2763 (1986)
http://dx.doi.org/10.1364/AO.25.002757


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Abstract

Layered synthetic microstructures (LSM) have been shown to be useful in obtaining high reflectivities in the soft x-ray and EUV portions of the spectrum, particularly at angles approaching normal incidence.

© 1986 Optical Society of America

History
Original Manuscript: February 13, 1986
Published: August 15, 1986

Citation
John F. Meekins, Raymond G. Cruddace, and Herbert Gursky, "Optimization of layered synthetic microstructures for narrowband reflectivity at soft x-ray and EUV wavelengths," Appl. Opt. 25, 2757-2763 (1986)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-25-16-2757


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References

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