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Applied Optics

Applied Optics


  • Vol. 25, Iss. 2 — Jan. 15, 1986
  • pp: 226–234

Photoelastic properties of metals measured by off-null ellipsometry

Kjeld Pedersen and Ole Keller  »View Author Affiliations

Applied Optics, Vol. 25, Issue 2, pp. 226-234 (1986)

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The complex coefficients of the reflection of light from an anisotropic conducting medium are derived assuming one of the optical axes to be perpendicular to the reflecting surface. The results represent generalizations of those obtained previously. The theory of reflection is developed with special reference to studies of strain-induced optical anisotropies in metals. How off-null ellipsometry can be used to determine complex photoelastic constants of metals is described. Measurements made on polycrystalline Al and Cu samples at different wavelengths in the visible region are reported.

© 1986 Optical Society of America

Original Manuscript: June 18, 1985
Published: January 15, 1986

Kjeld Pedersen and Ole Keller, "Photoelastic properties of metals measured by off-null ellipsometry," Appl. Opt. 25, 226-234 (1986)

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