An approximate analysis has been worked out to determine the optical admittance of an all-dielectric multilayer stack at wavelengths not too far away from the monitoring wavelength at which the layers are quarterwave thick. The expression, so obtained, is found to be useful in designing broadband antireflection coatings and interference filters.
© 1986 Optical Society of America
B. S. Verma, R. Bhattacharyya, and V. V. Shah, "Optical admittance of an all-dielectric unsymmetrical multilayer near the monitoring wavelength," Appl. Opt. 25, 315-319 (1986)