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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 25, Iss. 20 — Oct. 15, 1986
  • pp: 3602–3609

Characterization of the topography of vacuum-deposited films. 1: Light scattering

Maarten J. Verkerk and Ivo J. M. M. Raaymakers  »View Author Affiliations


Applied Optics, Vol. 25, Issue 20, pp. 3602-3609 (1986)
http://dx.doi.org/10.1364/AO.25.003602


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Abstract

The topography of vacuum-deposited aluminum films with different morphologies has been characterized by the angular distribution of the intensity of the diffusely scattered light. The results of these measurements are compared with morphological data obtained by the stylus technique and the SEM. It is shown that light scattering is a suitable technique for the characterization of such surfaces. The scattering spectrum is a fingerprint of the surface, and quantitative data can be obtained.

© 1986 Optical Society of America

History
Original Manuscript: February 16, 1986
Published: October 15, 1986

Citation
Maarten J. Verkerk and Ivo J. M. M. Raaymakers, "Characterization of the topography of vacuum-deposited films. 1: Light scattering," Appl. Opt. 25, 3602-3609 (1986)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-25-20-3602

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