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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 25, Iss. 20 — Oct. 15, 1986
  • pp: 3631–3634

Influence of metal films on the optical scatter and related microstructure of coated surfaces

Ghanim A. Al-Jumaily, S. R. Wilson, J. J. McNally, J. R. McNeil, Jean M. Bennett, and H. H. Hurt  »View Author Affiliations


Applied Optics, Vol. 25, Issue 20, pp. 3631-3634 (1986)
http://dx.doi.org/10.1364/AO.25.003631


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Abstract

Deposition of 0.1–1.0-μm thick metal on a CaF2 coated Si wafer causes a reduction in optical scatter and related microroughness. This effect is not observed when the coated surfaces are examined using a surface profilometer (Talystep). Scanning electron micrographs indicate that coated surfaces are smoother than uncoated surfaces.

© 1986 Optical Society of America

History
Original Manuscript: February 24, 1986
Published: October 15, 1986

Citation
Ghanim A. Al-Jumaily, S. R. Wilson, J. J. McNally, J. R. McNeil, Jean M. Bennett, and H. H. Hurt, "Influence of metal films on the optical scatter and related microstructure of coated surfaces," Appl. Opt. 25, 3631-3634 (1986)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-25-20-3631

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