Recent sputtering techniques have been used to produce layered synthetic microstructures (LSMs) as dispersing devices for varied applications in x-ray optics and spectroscopy. These analyzers, specially suited for synchrotron radiation, have been mounted in a two-parallel crystal monochromator. In this paper we show the first experimental results obtained with beryl crystals and multilayers for analyzing x-ray spectral distributions transmitted through screens or reflected on mirrors of copper near the L2 and L3 absorption edges. The significance of these findings is discussed in terms of comparison with natural and synthetic crystals and of designing a useful dispersing device for x-ray spectroscopy.
© 1986 Optical Society of America
Original Manuscript: August 29, 1985
Published: October 15, 1986
Michel Pirocchi, Robert Barchewitz, Suzanne Bodeur, Jean-Marc Esteva, Yves Lepetre, René Rivoira, René Philip, and Georges Rasigni, "Comparative efficiency of natural crystals and multilayers as dispersing devices in the copper L2,3 range," Appl. Opt. 25, 3640-3644 (1986)