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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 25, Iss. 20 — Oct. 15, 1986
  • pp: 3735–3739

Beam deflection as a method for testing optical components

Frank V. Kowalski, Thomas E. Milner, Jr., and Mickel J. Stanich  »View Author Affiliations


Applied Optics, Vol. 25, Issue 20, pp. 3735-3739 (1986)
http://dx.doi.org/10.1364/AO.25.003735


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Abstract

A new method for testing both refractive and reflective optical components using beam deflection is presented. For a beam with a 80-μm waist, 1-μrad deflections are detectable from a reflecting test surface. This corresponds to an average height resolution in the reflecting surface of eight-tenths of an angstrom over the dimensions of the beam.

© 1986 Optical Society of America

History
Original Manuscript: June 9, 1986
Published: October 15, 1986

Citation
Frank V. Kowalski, Thomas E. Milner, and Mickel J. Stanich, "Beam deflection as a method for testing optical components," Appl. Opt. 25, 3735-3739 (1986)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-25-20-3735


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References

  1. D. Malacara, Optical Shop Testing (Wiley, New York, 1978).
  2. B. Kelley, “Lateral-Effect Photodiodes,” Laser Focus 12, 38 (Mar.1976).
  3. J. T. Verdeyen, Laser Electronics (Prentice-Hall), Englewood Cliffs, NJ, 1981, Chap. 14.
  4. A. Yariv, Quantum Electronics (Wiley, New York, 1975), Chap. 6.
  5. J. M. Bennett, “Measurement of the rms Roughness, Autocovariance Function, and Other Statistical Properties of Optical Surfaces using a FECO Scanning Interferometer,” Appl. Opt. 15, 2705 (1976). [CrossRef] [PubMed]
  6. J. D. Jackson, Classical Electrodynamics (Wiley, New York, 1975, Sec. 9.12.

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