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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 25, Iss. 20 — Oct. 15, 1986
  • pp: 3735–3739

Beam deflection as a method for testing optical components

Frank V. Kowalski, Thomas E. Milner, Jr., and Mickel J. Stanich  »View Author Affiliations


Applied Optics, Vol. 25, Issue 20, pp. 3735-3739 (1986)
http://dx.doi.org/10.1364/AO.25.003735


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Abstract

A new method for testing both refractive and reflective optical components using beam deflection is presented. For a beam with a 80-μm waist, 1-μrad deflections are detectable from a reflecting test surface. This corresponds to an average height resolution in the reflecting surface of eight-tenths of an angstrom over the dimensions of the beam.

© 1986 Optical Society of America

History
Original Manuscript: June 9, 1986
Published: October 15, 1986

Citation
Frank V. Kowalski, Thomas E. Milner, and Mickel J. Stanich, "Beam deflection as a method for testing optical components," Appl. Opt. 25, 3735-3739 (1986)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-25-20-3735

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