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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 25, Iss. 22 — Nov. 15, 1986
  • pp: 4185–4191

Fringe formation with a cross-grating interferometer

Yih-Shyang Cheng  »View Author Affiliations


Applied Optics, Vol. 25, Issue 22, pp. 4185-4191 (1986)
http://dx.doi.org/10.1364/AO.25.004185


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Abstract

The interference pattern in a cross-grating interferometer is analyzed using first-order analysis. To this order, the fringes are found to be wavelength independent. With white light extended source illumination, the cross-gratinglike structure is localized in a plane disregarding the source position. It is also found that, with some constraint on the separation between cross gratings, the amplitude of a generalized cross grating can be imaged in monochromatic spatially incoherent light. By broadening the spectrum of the illuminating source, each four-beam set of equal paths would form its own cross-gratinglike structure.

© 1986 Optical Society of America

History
Original Manuscript: May 6, 1986
Published: November 15, 1986

Citation
Yih-Shyang Cheng, "Fringe formation with a cross-grating interferometer," Appl. Opt. 25, 4185-4191 (1986)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-25-22-4185


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References

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