Soft x-ray reflection from SiC, TiC, and WC mirrors
Applied Optics, Vol. 25, Issue 24, pp. 4586-4590 (1986)
http://dx.doi.org/10.1364/AO.25.004586
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Abstract
The optical constants of SiC, TiC, and WC in the soft x-ray region (80–1200 eV) derived from the incidenceangle dependence of the specular reflectance are reported. The angular dependence of the specular intensity can be explained by simple scattering theory with a Gaussian distribution of the surface roughness in the soft x-ray wavelength range.
© 1986 Optical Society of America
Citation
Mihiro Yanagihara, Michio Niwano, Tsuneharu Koide, Shigeru Sato, Tsuneaki Miyahara, Yasuo Iguchi, Shigeo Yamaguchi, and Taizo Sasaki, "Soft x-ray reflection from SiC, TiC, and WC mirrors," Appl. Opt. 25, 4586-4590 (1986)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-25-24-4586
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