The optical constants of SiC, TiC, and WC in the soft x-ray region (80–1200 eV) derived from the incidenceangle dependence of the specular reflectance are reported. The angular dependence of the specular intensity can be explained by simple scattering theory with a Gaussian distribution of the surface roughness in the soft x-ray wavelength range.
© 1986 Optical Society of America
Mihiro Yanagihara, Michio Niwano, Tsuneharu Koide, Shigeru Sato, Tsuneaki Miyahara, Yasuo Iguchi, Shigeo Yamaguchi, and Taizo Sasaki, "Soft x-ray reflection from SiC, TiC, and WC mirrors," Appl. Opt. 25, 4586-4590 (1986)