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Applied Optics

Applied Optics


  • Vol. 26, Iss. 1 — Jan. 1, 1987
  • pp: 37–40

Diode laser direct modulation heterodyne interferometer

Kimio Tatsuno and Yoshito Tsunoda  »View Author Affiliations

Applied Optics, Vol. 26, Issue 1, pp. 37-40 (1987)

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A new type of heterodyne interferometer was made through direct modulation of a diode laser wavelength. A measurement accuracy of better than λ/50 and repeatability of λ/100 were obtained. This interferometer shows promise for use in testing wavefront aberrations, especially in optical disk systems.

© 1987 Optical Society of America

Original Manuscript: June 13, 1986
Published: January 1, 1987

Kimio Tatsuno and Yoshito Tsunoda, "Diode laser direct modulation heterodyne interferometer," Appl. Opt. 26, 37-40 (1987)

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  1. K. Tatsuno, A. Arimoto, “Measurement and Analysis of Diode Laser Wave Fronts,” Appl. Opt, 20, 3520 (1981). [CrossRef] [PubMed]
  2. J. C. Wyant, “Use of an ac Heterodyne Lateral Shear Interferometer with Real-Time Wavefront Correction Systems,” Appl. Opt. 14, 2622 (1975). [CrossRef] [PubMed]
  3. J. H. Bruning et al., “Digital Wavefront Measuring Interferometer for Testing Optical Surfaces and Lenses,” Appl. Opt. 13, 2693 (1974). [CrossRef] [PubMed]
  4. S. Noda, K. Kojima, K. Kuroda, K. Kyuma, T. Nakayama, “Continuous-Wave Operation of Ridge Waveguide AlGaAs/GaAs Distributed-Feedback Lasers with Low Threshold Current,” in Technical Digest, Conference on Optical Fiber Communication (Optical Society of America, Washington, DC, 1986), paper TUJ4.
  5. M. Born, E. Wolf, Principles of Optics (Pergamon, New York1965), p. 469.
  6. K. Tatsuno, Y. Tsunoda, “Diode Laser Heterodyne Interferometer Using Direct Modulation of Wavelength,” in Technical Digest, Conference on Lasers and Electro-Optics (Optical Society of America, Washington, DC, 1985), paper FD2.

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