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Applied Optics

Applied Optics


  • Vol. 26, Iss. 14 — Jul. 15, 1987
  • pp: 2747–2751

Displacement and strain calculations by the phase shift method

Klaus Andresen  »View Author Affiliations

Applied Optics, Vol. 26, Issue 14, pp. 2747-2751 (1987)

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The phase shift method, well known in holographic interferometry, is applied to the deformation of line gratings. The method uses the moire effect but it determines local displacement or strain from the grey values of three shifted images instead of the coordinates of the fringes. The basic equations are derived from the transmittance function. The theoretical error with respect to a given displacement field is calculated by simulation. Real errors are investigated by related plotter-generated line gratings. The phase shift method is especially suitable for automatic digital image processing.

© 1987 Optical Society of America

Original Manuscript: December 20, 1986
Published: July 15, 1987

Klaus Andresen, "Displacement and strain calculations by the phase shift method," Appl. Opt. 26, 2747-2751 (1987)

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  1. R. Daendlicker, R. Thalmann, J. F. Willemin, “Fringe Interpolation by Two-Reference-Beam Holographic Interferometry: Reducing Sensitivity to Hologram Misalignment,” Opt. Commun. 42, 301 (1982). [CrossRef]
  2. B. Breuckmann, W. Thieme, “Ein rechnergestuetztes Holografie-System fuer industriellen Einsatz,” VDI Ber. (Ver. Dtsch. Ing.) 552, 27 (1985).
  3. K. Andresen, “The Phase Shift Method Applied to Moire Image Processing,” Optik 72, 115 (1986).
  4. K. Andresen, R. Ritter, “The Phase Shift Method Applied to Reflection Moire Pattern,” in Proceedings, Eighth International Conference on Experimental Stress Analysis351 (1986).
  5. K. Andresen, D. Klassen, “The Phase Shift Method Applied to Cross Grating Moire Measurement,” Opt. Laser Eng.7, 101 (1987), to be published. [CrossRef]

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