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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 26, Iss. 14 — Jul. 15, 1987
  • pp: 2836–2842

Guided-wave reflectometry with micrometer resolution

B. L. Danielson and C. D. Whittenberg  »View Author Affiliations


Applied Optics, Vol. 26, Issue 14, pp. 2836-2842 (1987)
http://dx.doi.org/10.1364/AO.26.002836


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Abstract

We describe a new type of optical reflectometry which is useful in testing single-mode lightguide systems. This technique uses a scanning Michelson interferometer in conjunction with a broadband illuminating source and cross-correlation detection. High resolution is achieved through the limited coherence of the backscattered radiation. With this approach it is possible to distinguish scattering centers separated by only a few micrometers. In some cases loss may be estimated for components in the transmission path of a test lightguide. The basic principles of this diagnostic technique, along with some performance characteristics, are illustrated for an all-fiber reflectometer. We also discuss several laboratory applications which serve to demonstrate the resolution capabilities of this measurement concept.

© 1987 Optical Society of America

History
Original Manuscript: February 23, 1987
Published: July 15, 1987

Citation
B. L. Danielson and C. D. Whittenberg, "Guided-wave reflectometry with micrometer resolution," Appl. Opt. 26, 2836-2842 (1987)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-26-14-2836

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