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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 26, Iss. 19 — Oct. 1, 1987
  • pp: 4310–4312

Optical method of measuring angular displacement using a diffraction pattern

Makoto Ami, Keijin Sato, Sumio Yamamoto, Osamu Kamada, and Hiroyuki Shibanuma  »View Author Affiliations


Applied Optics, Vol. 26, Issue 19, pp. 4310-4312 (1987)
http://dx.doi.org/10.1364/AO.26.004310


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Abstract

We investigate a method of measuring the angular displacement of an aperture when the diffraction pattern rotates. The data that are on a rectangular coordinate are transformed into the data on a polar coordinate. We calculate a cross-correlation function between the diffraction pattern that is rotated and the reference pattern. When the angular displacement is within ±5°, the error is <0.050. Then, we calculated the angular displacement of the pattern on a spherical coordinate system by personal computer simulation. Consequently, when the azimuth and the elevation of its rotation axis are within ±6°, the error is <0.1°.

© 1987 Optical Society of America

Citation
Makoto Ami, Keijin Sato, Sumio Yamamoto, Osamu Kamada, and Hiroyuki Shibanuma, "Optical method of measuring angular displacement using a diffraction pattern," Appl. Opt. 26, 4310-4312 (1987)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-26-19-4310

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