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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 26, Iss. 2 — Jan. 15, 1987
  • pp: 377–382

Quantitative phase analysis in electron holographic interferometry

Toyohiko Yatagai, Katsuyuki Ohmura, Shigeo Iwasaki, Shuji Hasegawa, Junji Endo, and Akira Tonomura  »View Author Affiliations


Applied Optics, Vol. 26, Issue 2, pp. 377-382 (1987)
http://dx.doi.org/10.1364/AO.26.000377


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Abstract

Holographic interferometry in an electron microscope and its phase analysis technique are described. The fringe scanning method is used to gain high sensitivity in phase detection. An example of measuring a magnetic field of a fine particle is presented. The measurement accuracy for median filtering is about 1/70 fringe corresponding to the magnetic flux sensitivity of 6 × 10−17 Wb. Noise reduction techniques are also discussed.

© 1987 Optical Society of America

History
Original Manuscript: June 23, 1986
Published: January 15, 1987

Citation
Toyohiko Yatagai, Katsuyuki Ohmura, Shigeo Iwasaki, Shuji Hasegawa, Junji Endo, and Akira Tonomura, "Quantitative phase analysis in electron holographic interferometry," Appl. Opt. 26, 377-382 (1987)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-26-2-377

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