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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 26, Iss. 4 — Feb. 15, 1987
  • pp: 729–737

Optical thickness monitoring sensitivity improvement using graphical methods

Ronald R. Willey  »View Author Affiliations


Applied Optics, Vol. 26, Issue 4, pp. 729-737 (1987)
http://dx.doi.org/10.1364/AO.26.000729


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Abstract

Semidirect level monitoring has error compensation capabilities of potential benefit to optical coatings of certain types. A review of the principles of level monitoring using circle diagrams shows how to design a level monitoring scheme for various cases, including the use of precoated monitoring chips. The film thickness sensitivities for various optical monitoring strategies differ considerably. Optimum level trigger point monitoring offers improved sensitivity of change in reflectance vs change in optical thickness. This procedure is also expected to give small thickness errors when optically monitored. Optimum level trigger point monitoring, and its application, is fully described.

© 1987 Optical Society of America

History
Original Manuscript: October 20, 1986
Published: February 15, 1987

Citation
Ronald R. Willey, "Optical thickness monitoring sensitivity improvement using graphical methods," Appl. Opt. 26, 729-737 (1987)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-26-4-729

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