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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 26, Iss. 6 — Mar. 15, 1987
  • pp: 983–989

Mass fraction profiling based on x-ray tomography and its application to characterizing porous silica boules

Werner J. Glantschnig and Albert Holliday  »View Author Affiliations


Applied Optics, Vol. 26, Issue 6, pp. 983-989 (1987)
http://dx.doi.org/10.1364/AO.26.000983


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Abstract

Mass fraction profiling is a specialized tomographic technique designed to allow one to measure the concentration profiles of the component species of a synthetic composite material. While developed for the express purpose of determining the dopant, density, and porosity profiles of unsintered soot boules, the method should also be useful in analyzing other types of ceramic such as dried gels. Mass fraction profiling amounts to a three-step process consisting of scanning the object of interest with well-collimated beams of x rays, reconstructing the attenuation coefficient profiles for several x-ray energies, and generating the density and concentration or mass fraction profiles. The method for determining these profiles is outlined, and some measurement results obtained for soot boules are presented.

© 1987 Optical Society of America

History
Original Manuscript: July 26, 1986
Published: March 15, 1987

Citation
Werner J. Glantschnig and Albert Holliday, "Mass fraction profiling based on x-ray tomography and its application to characterizing porous silica boules," Appl. Opt. 26, 983-989 (1987)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-26-6-983


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