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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 26, Iss. 9 — May. 1, 1987
  • pp: 1603–1606

New measurement system for fault location in optical waveguide devices based on an interferometric technique

Kazumasa Takada, Itaru Yokohama, Kazumori Chida, and Juichi Noda  »View Author Affiliations


Applied Optics, Vol. 26, Issue 9, pp. 1603-1606 (1987)
http://dx.doi.org/10.1364/AO.26.001603


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Abstract

A new measurement system for fault location in optical waveguide devices is presented. The system consists of a fiber-optic Mach-Zehnder and a bulk-type Michelson interferometers. The spatial resolution of the scatter distribution is <380 μm, which is limited by the averaging time. The minimum detectable backscattered power is −116 dB relative to the light power propagating in the waveguides. Preliminary experimental results using single-mode fibers <10 cm long are demonstrated.

© 1987 Optical Society of America

History
Original Manuscript: November 14, 1986
Published: May 1, 1987

Citation
Kazumasa Takada, Itaru Yokohama, Kazumori Chida, and Juichi Noda, "New measurement system for fault location in optical waveguide devices based on an interferometric technique," Appl. Opt. 26, 1603-1606 (1987)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-26-9-1603

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