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Applied Optics

Applied Optics


  • Vol. 27, Iss. 12 — Jun. 15, 1988
  • pp: 2621–2626

Universal ultrahigh vacuum facility for the measurement of the optical properties of solids

John A. LaFemina and A. Hamid Madjid  »View Author Affiliations

Applied Optics, Vol. 27, Issue 12, pp. 2621-2626 (1988)

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An apparatus is described in which the reflectance and transmittance of a hot sample and a cold sample may be measured simultaneously and differentially in the wavelength region from the infrared to the vacuum ultraviolet. These measurements may be carried out under an ultrahigh vacuum or a gaseous ambience, and the surfaces may be temperature treated (e.g., flashed atomically clean) before the measurement. The hot–cold differential capability of the apparatus is convenient when considering the temperature dependence of optical parameters.

© 1988 Optical Society of America

Original Manuscript: April 15, 1987
Published: June 15, 1988

John A. LaFemina and A. Hamid Madjid, "Universal ultrahigh vacuum facility for the measurement of the optical properties of solids," Appl. Opt. 27, 2621-2626 (1988)

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