Wafer level high-frequency measurements of photodetector characteristics
Applied Optics, Vol. 27, Issue 15, pp. 3059-3061 (1988)
http://dx.doi.org/10.1364/AO.27.003059
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Abstract
Citation
John A. Modolo, Gordon Wood Anderson, Francis J. Kub, and Ingham A. G. Mack, "Wafer level high-frequency measurements of photodetector characteristics," Appl. Opt. 27, 3059-3061 (1988)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-27-15-3059
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