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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 27, Iss. 16 — Aug. 15, 1988
  • pp: 3334–3340

Characterization of dielectric-coated, metal mirrors using surface plasmon spectroscopy

Eduardo Fontana, R. H. Pantell, and M. Moslehi  »View Author Affiliations


Applied Optics, Vol. 27, Issue 16, pp. 3334-3340 (1988)
http://dx.doi.org/10.1364/AO.27.003334


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Abstract

The surface plasmon spectroscopy (SPS) technique is used in the characterization of dielectric-coated metal mirrors. Experiments performed on a MgF2-coated aluminum mirror indicate good agreement between SPS and ellipsometry techniques for the determination of coating thickness. In addition, the optical constants of aluminum obtained from the same experiment agree well with values presented in the literature. Advantages of SPS are that it is a simple procedure providing a high degree of accuracy, and only a single measurement is required to yield both the film thickness and the complex permittivity of the substrate.

© 1988 Optical Society of America

History
Original Manuscript: October 5, 1987
Published: August 15, 1988

Citation
Eduardo Fontana, R. H. Pantell, and M. Moslehi, "Characterization of dielectric-coated, metal mirrors using surface plasmon spectroscopy," Appl. Opt. 27, 3334-3340 (1988)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-27-16-3334


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References

  1. E. Shiles, T. Sasaki, M. Inokuti, D. Y. Smith, “Self-Consistency and Sum Rule Tests in the Kramers-Kronig Analysis of Optical Data: Applications to Aluminum,” Phys. Rev. B 22, 1612 (1980). [CrossRef]
  2. J. D. E. Mclntyre, “Optical Reflection Spectroscopy of Chemisorbed Monolayers,” in Optical Properties of Solids, New Developments, B. O. Seraphin, Ed. (North-Holland, Amsterdam, 1975), Chap. 11; D. E. Aspnes, “Spectroscopic Ellipsometry of Solids,” in Optical Properties of Solids, New Developments, B. O. Seraphin, Ed. (North-Holland, Amsterdam, 1975), Chap. 15.
  3. M. Malin, K. Vedam, “Generalized Ellipsometric Method for the Determination of all the Optical Constants of the System: Optically Absorbing Film on an Absorbing Substrate,” Surf. Sci. 56, 49 (1976). [CrossRef]
  4. A. Otto, “Spectroscopy of Surface Polaritons by Attenuated Total Reflection,” in Optical Properties of Solids, New Developments, B. O. Seraphin, Ed. (North-Holland, Amsterdam, 1975), Chap. 13.
  5. M. T. Flanagan, R. H. Pantell, “Surface Plasmon Resonance and Immunosensors,” Electron. Lett. 20, 968 (1984). [CrossRef]
  6. H. Raether, “The Dispersion Relation of Surface Plasmons on Rough Surfaces; A Comment on Roughness Data,” Surf. Sci. 125, 624 (1983); “Surface Plasmons and Roughness,” in Surface Polaritons, V. M. Agranovich, D. L. Mills, Eds. (North-Holland, Amsterdam, 1982), Chap. 9. [CrossRef]
  7. E. Fontana, R. H. Pantell, “Characterization of Multilayer Rough Surfaces Using Surface Plasmon Spectroscopy,” Phys. Rev. B 37, 3164 (1988). [CrossRef]
  8. E. Kretschmann, “Die Bestimmung optischer Konstanten von Metallen durch Anregung von Oberflachenplasmaschwingungen,” Z. Phys. 241, 313 (1971). [CrossRef]
  9. W. P. Chen, J. M. Chen, “Use of Surface Plasma Waves for Determination of the Thickness and Optical Constants of Thin Metallic Films,” J. Opt. Soc. Am. 71, 189 (1981). [CrossRef]
  10. E. T. Hutcheson, G. Hass, J. K. Coulter, “A Direct Comparison of the Visible and Ultraviolet Reflectance of Aluminum Films Evaporated in Conventional and Ultra-High-Vacuum Systems,” Opt. Commun. 4, 213 (1971). [CrossRef]
  11. W. L. Wolfe, Properties of Optical Materials,” in Handbook of Optics, W. G. Discroll, W. Vaughan, Eds. (McGraw-Hill, New York, 1978), p. 7.95.
  12. W. P. Chen, J. M. Chen, “Surface Plasma Wave study of Sub-monolayer Cs and Cs–O Covered Ag Surfaces,” Surf. Sci. 91, 601 (1980). [CrossRef]
  13. K. L. Nielsen, Methods in Numerical Analysis (Macmillan, New York, 1964), p. 308.
  14. A. G. Mathewson, H. P. Meyers, “Absolute Values of the Optical Constants of Some Pure Metals,” Phys. Scr. 4, 291 (1971). [CrossRef]
  15. G. Hass, J. E. Waylonis, “Optical Constants and Reflectance and Transmittance of Evaporated Aluminum in the Visible and Ultraviolet,” J. Opt. Soc. Am. 51, 719 (1961). [CrossRef]
  16. A. Otto, W. Sohler, “The Influence of the Substrate on the Optical Constants of Al Films,” Solid State Commun. 16, 1319 (1975). [CrossRef]
  17. W. D. Kimura, D. H. Ford, “Photoacoustic Calorimetry System for Glancing Incidence Mirror Absorptance Measurements,” Rev. Sci. Instrum. 57, 2754 (1986). [CrossRef]
  18. W. D. Kimura, F. J. Woodberry, L. F. DeSandre, “Model Comparisons with Glancing Incidence Measurements of Over-coated Metal Mirrors,” in Proceedings, 1986 Boulder Damage Symposium (to be published).

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