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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 27, Iss. 16 — Aug. 15, 1988
  • pp: 3382–3391

Photon migration in layered media

Ralph Nossal, J. Kiefer, G. H. Weiss, R. Bonner, H. Taitelbaum, and S. Havlin  »View Author Affiliations


Applied Optics, Vol. 27, Issue 16, pp. 3382-3391 (1988)
http://dx.doi.org/10.1364/AO.27.003382


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Abstract

Surface emission profiles and related functions are computed for particles (photons) migrating within a semi-infinite medium containing a surface layer whose absorbance differs from that of the underlying layer. Photons are assumed to be inserted at a single point on the surface. In certain cases distinct features appear in the emission profiles which enable determination of the thickness of the top layer and of the absorption coefficients of both layers. Computations are performed to provide estimates of parameter ranges for which the presence of one layer distorts photon emission profiles from the other. Several ancillary functions are calculated, including the absorbance profile as a function of depth, the expected path length of photons that are reemitted at a distance ρ from the point of insertion, and the average depth probed by those reemitted photons.

© 1988 Optical Society of America

History
Original Manuscript: September 14, 1987
Published: August 15, 1988

Citation
Ralph Nossal, J. Kiefer, G. H. Weiss, R. Bonner, H. Taitelbaum, and S. Havlin, "Photon migration in layered media," Appl. Opt. 27, 3382-3391 (1988)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-27-16-3382

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