OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 27, Iss. 16 — Aug. 15, 1988
  • pp: 3522–3525

Transmission x-ray diffraction grating alignment using a photoelastic modulator

Erik H. Anderson, Alan M. Levine, and Mark L. Schattenburg  »View Author Affiliations


Applied Optics, Vol. 27, Issue 16, pp. 3522-3525 (1988)
http://dx.doi.org/10.1364/AO.27.003522


View Full Text Article

Enhanced HTML    Acrobat PDF (592 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

We have developed a high-resolution alignment technique which utilizes the partial polarization property of fine period transmission gratings. It is especially useful when the grating period is sufficiently small so that there are no visible diffracted orders. This technique uses a photoelastic modulator (PEM) to produce an intensity signal that is proportional to the sine of twice the angle between the grating lines and the PEM crystal axis. The experimentally demonstrated resolution of this technique on 200-nm period gold transmission gratings is better than 1 sec of arc. This technique was developed to align x-ray transmission gratings for spectroscopy and interferometry applications.

© 1988 Optical Society of America

History
Original Manuscript: January 26, 1988
Published: August 15, 1988

Citation
Erik H. Anderson, Alan M. Levine, and Mark L. Schattenburg, "Transmission x-ray diffraction grating alignment using a photoelastic modulator," Appl. Opt. 27, 3522-3525 (1988)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-27-16-3522


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. H. I. Smith, E. H. Anderson, M. L. Schattenburg, “Planar Techniques for Fabricating X-Ray Diffraction Gratings and Zone Plates,” in Symposium on X-Ray Microscopy, Gottingen, 14–16 Sept. 1983, Springer Series in Optical Sciences, Vol. 43, X-Ray Microscopy, D. Rudolph, G. Schmahl, Eds. (Springer-Verlag, Berlin, 1984), pp. 51–61.
  2. N. M. Ceglio, R. L. Kauffman, A. M. Hawryluk, H. Medecki, “A Time Resolved X-ray Transmission Grating Spectrometer for Investigation of Laser Produced Plasmas,” Appl. Opt. 22, 318 (1983). [CrossRef] [PubMed]
  3. C. R. Canizares, M. L. Schattenburg, H. I. Smith, “The Medium and High Energy Transmission Grating Spectrometer for AXAF,” Proc. Soc. Photo-Opt. Instrum. Eng. 597, 253 (1985).
  4. P. Rockett, KMS Fusion, Inc., personal communication.
  5. H. E. Torberg, W. J. Rowan, J. R. Vyce, “Optical Instruments for Metrology,” in Handbook of Optics, W. G. Driscoll, W. Vaughn, Eds. (McGraw-Hill, New York, 1978), p. 16–42.
  6. J. C. Kemp, “Piezo-Optical Birefringence Modulators: New Use for a Long-Known Effect,” J. Opt. Soc. Am. 59, 950 (1969).
  7. S. N. Jasperson, S. E. Schnatterly, “An Improved Method for High Reflectivity Ellipsometry Based on a New Polarization Modulation Technique,” Rev. Sci. Instrum. 40, 761 (1969). [CrossRef]
  8. H. A. Haus, Waves and Fields in Optoelectronics (Prentice-Hall, Englewood Cliffs, NJ, 1984), p. 370.
  9. Melles Griot 3 FCG 167.
  10. Model PEM-80, Hinds International, Inc., Portland, OR.
  11. Model D656, Davidson Optronics, Inc., West Covina, CA.

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

Figures

Fig. 1 Fig. 2
 

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited