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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 27, Iss. 2 — Jan. 15, 1988
  • pp: 246–278

Optical constants for thin films of Ti, Zr, Nb, Mo, Ru, Rh, Pd, Ag, Hf, Ta, W, Re, Ir, Os, Pt, and Au from 24 Å to 1216 Å

David L. Windt, Webster C. Cash, Jr., M. Scott, P. Arendt, B. Newnam, R. F. Fisher, and A. B. Swartzlander  »View Author Affiliations


Applied Optics, Vol. 27, Issue 2, pp. 246-278 (1988)
http://dx.doi.org/10.1364/AO.27.000246


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Abstract

Reflectance vs incidence angle measurements have been performed from 24 Å to 1216 Å on electron-beam evaporated samples of Ti, Zr, Nb, Mo, Ru, Rh, Pd, Ag, Hf, Ta, W, Re, Os, Ir, Pt, and Au, and using a nonlinear least-squares curve-fitting technique, the optical constants have been determined. Independently measured values of the incident beam polarization, film thicknesses, and film surface roughnesses are incorporated into the derivation of the optical constants. Additionally, Auger electron spectroscopy depth profiling measurements have been performed on each sample to characterize sample composition including oxidation and contamination.

© 1988 Optical Society of America

History
Original Manuscript: July 28, 1987
Published: January 15, 1988

Citation
David L. Windt, Webster C. Cash, M. Scott, P. Arendt, B. Newnam, R. F. Fisher, and A. B. Swartzlander, "Optical constants for thin films of Ti, Zr, Nb, Mo, Ru, Rh, Pd, Ag, Hf, Ta, W, Re, Ir, Os, Pt, and Au from 24 Å to 1216 Å," Appl. Opt. 27, 246-278 (1988)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-27-2-246


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References

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