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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 27, Iss. 20 — Oct. 15, 1988
  • pp: 4336–4341

Schottky type photodiodes as detectors in the VUV and soft x-ray range

Michael Krumrey, Erich Tegeler, Jochen Barth, Michael Krisch, Franz Schäfers, and Reinhard Wolf  »View Author Affiliations


Applied Optics, Vol. 27, Issue 20, pp. 4336-4341 (1988)
http://dx.doi.org/10.1364/AO.27.004336


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Abstract

The quantum efficiencies of semiconductor photodiodes have been measured at photon energies from 5 to 3500 eV. For silicon photodiodes strong radiation-induced effects were found. GaAsP and GaP Schottky diodes show remarkable stability and high quantum efficiency. Use of Schottky diodes for spectroscopic and radiometric measurements is discussed.

© 1988 Optical Society of America

History
Original Manuscript: April 13, 1988
Published: October 15, 1988

Citation
Michael Krumrey, Erich Tegeler, Jochen Barth, Michael Krisch, Franz Schäfers, and Reinhard Wolf, "Schottky type photodiodes as detectors in the VUV and soft x-ray range," Appl. Opt. 27, 4336-4341 (1988)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-27-20-4336

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