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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 27, Iss. 22 — Nov. 15, 1988
  • pp: 4609–4611

Effect of multiple internal reflections on the stability of electrooptic and magnetooptic sensors

K. S. Lee and G. W. Day  »View Author Affiliations


Applied Optics, Vol. 27, Issue 22, pp. 4609-4611 (1988)
http://dx.doi.org/10.1364/AO.27.004609


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No abstract available.

History
Original Manuscript: April 25, 1988
Published: November 15, 1988

Citation
K. S. Lee and G. W. Day, "Effect of multiple internal reflections on the stability of electrooptic and magnetooptic sensors," Appl. Opt. 27, 4609-4611 (1988)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-27-22-4609


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References

  1. O. S. Heavens, Optical Properties of Thin Films (Dover, New York, 1965).
  2. D. A. Holmes, “Exact Theory of Retardation Plates,” J. Opt. Soc. Am 54, 1115 (1964). [CrossRef]
  3. W. A. Shurcliff, Polarized Light; Production and Use (Harvard U.P.Cambridge, 1962).
  4. G. W. Day, P. Hale, M. Deeter, T. Milner, D. Conrad, S. Etzel, “Limits to the Precision of Electro-Optic and Magneto-Optic Sensors,” Natl. Bur. Stand. (U.S.) Tech. Note 1307 (1987); G. W. Day, P. Hale, M. Deeter, T. Milner, D. Conrad, S. EtzelElectric Power Research Institute Report EL 5431, Vol. 1 (1987).

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