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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 27, Iss. 22 — Nov. 15, 1988
  • pp: 4645–4652

Optical inspection of industrial materials by unidimensional Fourier transform

P. Cielo and G. Vaudreuil  »View Author Affiliations


Applied Optics, Vol. 27, Issue 22, pp. 4645-4652 (1988)
http://dx.doi.org/10.1364/AO.27.004645


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Abstract

Optical techniques are appropriate to industrial inspection tasks because of their noncontact nature, high response speed, and increasing ruggedness and affordability. This paper relates to the development of two electrooptical systems for the inspection of woven webs and of extruded wires. In both cases, parameters of industrial interest are inferred from the light beam distribution after interaction with the material under analysis. Suitable optical configurations provide a laminar light beam which is line array scanned and Fourier transform processed. The emphasis is on the maximization of the measurement reliability, depth of field, and processing speed according to on-line application requirements.

© 1988 Optical Society of America

History
Original Manuscript: March 15, 1988
Published: November 15, 1988

Citation
P. Cielo and G. Vaudreuil, "Optical inspection of industrial materials by unidimensional Fourier transform," Appl. Opt. 27, 4645-4652 (1988)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-27-22-4645


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References

  1. B. G. Batchelor, D. A. Hill, D. C. Hodgson, Eds., Automated Visual Inspection (IFS/North-Holland, U.K., 1985).
  2. A. Browne, L. Norton-Wayne, Vision and Information Processing for Automation (Plenum, New York, 1986).
  3. P. Cielo, Optical Techniques for Industrial Inspection (Academic, Boston, 1988).
  4. B. Vogeley, “Vision Systems or Vision Sensors?” Sensor Rev. 7(3), 152 (1987). [CrossRef]
  5. D. L. Hudson, “A Practical Solution Using a New Approach to Machine Vision,” in Conference Proceedings, QualTest-2, ASNT/ASQC/SME (1983), p. 27-1.
  6. P. Chavel, T. C. Strand, “Range Measurement Using Talbot Diffraction Imaging of Gratings,” Appl. Opt. 23, 862 (1984). [CrossRef] [PubMed]
  7. M. W. Siegel, “Lasers and CCD’s for Flash Measurement of Small Diameters,” Proc. Soc. Photo-Opt. Instrum. Eng. 730, 119 (1986).
  8. P. Cielo, G. Vaudreuil, M. Lamontagne, “In-Process Product Control by Electro-optical Sensors,” in ISA-Digicom ’87, Montreal (21–22 Oct. 1987).
  9. H. L. Kasdan, U.S. Patent3,937,580 (1976).
  10. M. Kerker, The Scattering of Light and Other Electromagnetic Radiation (Academic, New York, 1969).
  11. H. C. van de Hulst, Light Scattering by Small Particles (Dover, New York, 1981).
  12. M. Born, E. Wolf, Principles of Optics (Pergamon, Oxford, 1975).
  13. Y. S. Touloukian, R. K. Kirby, R. E. Taylor, P. D. Desai, Thermophysical Properties of Matter, Vol. 12 (IFI/Plenum, New York, 1975), p. 1217.
  14. G. T. Dyos, S. A. Smith, “Two New Methods for Noncontact Temperature Measurement,” Proc. Soc. Photo-Opt. Instrum. Eng. 665, 96 (1986).

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