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Applied Optics

Applied Optics


  • Vol. 27, Iss. 22 — Nov. 15, 1988
  • pp: 4725–4730

Interferometers: equivalent sine condition

Juan M. Simon and Silvia A. Comastri  »View Author Affiliations

Applied Optics, Vol. 27, Issue 22, pp. 4725-4730 (1988)

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The parallelism we have previously drawn between an interferometer and an equivalent optical system enables us to study both systems similarly. The constant contrast condition along the localization surface is equivalent to the condition of isoplanatism at the system image. As the sine condition is necessary for a system to be isoplanatic, a relationship we call the equivalent sine condition must hold if the contrast is constant. Some classic interferometers do not satisfy this condition and we here analyze the Michelson interferometer. Moreover, we find that, for the record of interference fringes to be a pseudohologram, this condition must be unfulfilled.

© 1988 Optical Society of America

Original Manuscript: November 13, 1987
Published: November 15, 1988

Juan M. Simon and Silvia A. Comastri, "Interferometers: equivalent sine condition," Appl. Opt. 27, 4725-4730 (1988)

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  1. J. M. Simon, Silvia A. Comastri, “Fringe Localization Depth,” Appl. Opt. 26, 5125 (1987) [CrossRef] [PubMed]
  2. S. A. Comastri, J. M. Simon, “Ray Tracing, Aberration Function and Spatial Frequencies,” Optik 66, 175 (1984).
  3. J. M. Simon, J. O. Ratto, “Modulated Interference Gratings for Image Reconstruction: A Classification for Holographic Methods and Other Techniques,” Opt. Pura Apl. 19, 93 (1986).
  4. M. Born, E. Wolf, Principles of Optics (Pergamon, New York, 1964).
  5. H. H. Hopkins, “Canonical Pupil Coordinates in Geometrical and Diffraction Image Theory,” Jpn. J. Appl. Phys.Suppl. 1 4, 31 (1965).

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