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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 27, Iss. 23 — Dec. 1, 1988
  • pp: 4798–4799

Nondestructive III–V epitaxial layer thickness measurements in the visible and near IR by reflectance spectroscopy

Lawrence E. Tarof  »View Author Affiliations


Applied Optics, Vol. 27, Issue 23, pp. 4798-4799 (1988)
http://dx.doi.org/10.1364/AO.27.004798


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No abstract available.

History
Original Manuscript: April 16, 1988
Published: December 1, 1988

Citation
Lawrence E. Tarof, "Nondestructive III–V epitaxial layer thickness measurements in the visible and near IR by reflectance spectroscopy," Appl. Opt. 27, 4798-4799 (1988)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-27-23-4798

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