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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 27, Iss. 23 — Dec. 1, 1988
  • pp: 4941–4946

Comparison and combined operation of a moire deflectometer, Fizeau interferometer, and schlieren device

Oded Kafri and Kathi Kreske  »View Author Affiliations


Applied Optics, Vol. 27, Issue 23, pp. 4941-4946 (1988)
http://dx.doi.org/10.1364/AO.27.004941


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Abstract

We demonstrate an instrument which enables the combined operation of a moire deflectometer, Fizeau interferometer, and schlieren device. By using each mode separately, it is possible to compare the three methods, and by combined operation, to benefit from the advantages of each method.

© 1988 Optical Society of America

History
Original Manuscript: March 7, 1988
Published: December 1, 1988

Citation
Oded Kafri and Kathi Kreske, "Comparison and combined operation of a moire deflectometer, Fizeau interferometer, and schlieren device," Appl. Opt. 27, 4941-4946 (1988)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-27-23-4941


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References

  1. M. V. R. K. Murty, “Fizeau Interferometer,” in Optical Shop Testing, D. Malacara, Ed. (Wiley, New York, 1978), Sec. 1.2.
  2. Zygo Corp., Photonics Handbook1987 (Lauren Publishing Corp., Pittsfield, MA), pp. H-296.
  3. J. Ojeda-Castaneda, “Foucault or Knife-Edge Test,” in Optical Shop Testing, D. Malacara, Ed. (Wiley, New York, 1978), Sec. 8.2.
  4. O. Kafri, “Noncoherent Method for Phase Object Mapping,” Opt. Lett. 5, 555 (1980). [CrossRef] [PubMed]
  5. O. Kafri, I. Glatt, “Moire Deflectometry—A Ray Deflection Approach to Optical Testing,” Opt. Eng. 24, 944 (1985). [CrossRef]
  6. O. Kafri, I. Glatt, “High Sensitivity Reflection-Transmission Moire Deflectometer,” Appl. Opt. 27, 351 (1988). [CrossRef] [PubMed]
  7. N. Abramson, “The ‘Interferoscope,’ a New Type of Interferometer with Variable Fringe Separation,” Optik 30, 56 (1969).

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