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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 27, Iss. 24 — Dec. 15, 1988
  • pp: 5051–5066

Electrooptic effect calculations: simplified procedure for arbitrary cases

Theresa A. Maldonado and Thomas K. Gaylord  »View Author Affiliations


Applied Optics, Vol. 27, Issue 24, pp. 5051-5066 (1988)
http://dx.doi.org/10.1364/AO.27.005051


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Abstract

To aid in the design of electrooptic devices, a simplified procedure is introduced for determining the principal indices of refraction and the orientations of the index ellipsoid when an electric field is applied. The approach employs the general Jacobi method, and it is applicable to an arbitrary isotropic, uniaxial, or biaxial crystal class with an arbitrary direction of applied field. It includes a straightforward approach for labeling the new principal dielectric axes so as to produce the minimum global rotation of the ellipsoid from the zero-field principal dielectric axes. The necessary calculations can be easily implemented with a pocket calculator and are often found to be more accurate than those obtained with larger computers using standard library math packages. Furthermore, for analyzing device performance, simple analytic expressions for the orientations of the fast and slow polarization axes and the fast and slow indices of refraction are derived for a given arbitrary direction of optical propagation and any arbitrary direction of applied electric field. The calculational procedure is applicable to linear and quadratic electrooptic effects and the photoelastic effect in isotropic, uniaxial, and biaxial crystals. Illustrative examples for GaAs, LiNbO3, and KDP are presented.

© 1988 Optical Society of America

History
Original Manuscript: July 7, 1988
Published: December 15, 1988

Citation
Theresa A. Maldonado and Thomas K. Gaylord, "Electrooptic effect calculations: simplified procedure for arbitrary cases," Appl. Opt. 27, 5051-5066 (1988)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-27-24-5051


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