Abstract

For the design and optimization of the fabrication condition of distributed-index planar microlenses, it is necessary to evaluate the N.A., focal length, focused spot, and aberration of a fabricated lens. In this paper, a ray tracing method is improved for this purpose, and properties of planar microlenses are evaluated. An ion concentration matrix is proposed to simplify lens design.

© 1988 Optical Society of America

Index profile of a planar microlens by ion exchange/diffusion

Xiao-Fan Zhu and Kenichi Iga
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Ray traces in a distributed-index planar microlens

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