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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 27, Iss. 3 — Feb. 1, 1988
  • pp: 468–471

Characterization of ion-exchanged planar microlenses by ray tracing

Xiaofan Zhu and Kenichi Iga  »View Author Affiliations


Applied Optics, Vol. 27, Issue 3, pp. 468-471 (1988)
http://dx.doi.org/10.1364/AO.27.000468


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Abstract

For the design and optimization of the fabrication condition of distributed-index planar microlenses, it is necessary to evaluate the N.A., focal length, focused spot, and aberration of a fabricated lens. In this paper, a ray tracing method is improved for this purpose, and properties of planar microlenses are evaluated. An ion concentration matrix is proposed to simplify lens design.

© 1988 Optical Society of America

History
Original Manuscript: March 31, 1987
Published: February 1, 1988

Citation
Xiaofan Zhu and Kenichi Iga, "Characterization of ion-exchanged planar microlenses by ray tracing," Appl. Opt. 27, 468-471 (1988)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-27-3-468

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