Estimation of a planar microlens by oblique ray tracing
Applied Optics, Vol. 27, Issue 3, pp. 480-485 (1988)
http://dx.doi.org/10.1364/AO.27.000480
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Abstract
Ray tracing for a planar microlens by solving a ray equation is performed. Off-axial dependence of spot size and wave aberration of fabricated planar microlens samples are estimated. A typical spherical aberration of the present planar microlenses at N.A. = 0.3 was 1.1λ. The curvature field was -0.7λ, and comatic aberration was 0.3λ for a tilted angle of 5° at 0.3 N.A. It was estimated that the field curvature and comatic aberration were dominant next to the spherical aberration.
© 1988 Optical Society of America
Citation
Shigeyoshi Misawa and Kenichi Iga, "Estimation of a planar microlens by oblique ray tracing," Appl. Opt. 27, 480-485 (1988)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-27-3-480
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