The refractive index as a function of spatial coordinate in three Czochralski grown germanium—silicon alloy GRIN crystals has been measured using ac interferometric techniques. The interferometer is capable of high phase resolution and is computer controlled for real-time data processing. The measured refractive-index profiles were compared to theoretical profiles which were calculated from a model based on the segregation effect of silicon in germanium.
© 1988 Optical Society of America
Denis P. Naughton, Joseph J. Miceli, Jr., and Duncan T. Moore, "Measurement of the refractive-index profile in polycrystalline germanium—silicon alloy GRIN crystals," Appl. Opt. 27, 505-507 (1988)