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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 27, Iss. 3 — Feb. 1, 1988
  • pp: 505–507

Measurement of the refractive-index profile in polycrystalline germanium–silicon alloy GRIN crystals

Denis P. Naughton, Joseph J. Miceli, Jr., and Duncan T. Moore  »View Author Affiliations


Applied Optics, Vol. 27, Issue 3, pp. 505-507 (1988)
http://dx.doi.org/10.1364/AO.27.000505


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Abstract

The refractive index as a function of spatial coordinate in three Czochralski grown germanium–silicon alloy GRIN crystals has been measured using ac interferometric techniques. The interferometer is capable of high phase resolution and is computer controlled for real-time data processing. The measured refractive-index profiles were compared to theoretical profiles which were calculated from a model based on the segregation effect of silicon in germanium.

© 1988 Optical Society of America

History
Original Manuscript: June 17, 1987
Published: February 1, 1988

Citation
Denis P. Naughton, Joseph J. Miceli, and Duncan T. Moore, "Measurement of the refractive-index profile in polycrystalline germanium–silicon alloy GRIN crystals," Appl. Opt. 27, 505-507 (1988)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-27-3-505


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References

  1. J. J. Miceli, “Infrared Gradient Index Optics: Materials, Fabrication and Testing,” Ph.D. Thesis, U. Rochester (1982).
  2. D. P. Naughton, “Fabrication and Testing of Gradient Index Materials,” M.S. Thesis, U. Rochester (1986).

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