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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 27, Iss. 3 — Feb. 1, 1988
  • pp: 508–515

Real-time index profile measurement during GRIN glass fabrication

Susan Houde-Walter and Duncan T. Moore  »View Author Affiliations


Applied Optics, Vol. 27, Issue 3, pp. 508-515 (1988)
http://dx.doi.org/10.1364/AO.27.000508


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Abstract

A new instrument for measuring the evolution of index profiles during diffusion in hot (500°C) glass is presented. This instrument, called the oven interferometer, has a spatial resolution of 10 μm at 0.6471 μm and a phase resolution of λ/50. The development of index profiles with both time-dependent and constant boundary conditions is shown.

© 1988 Optical Society of America

History
Original Manuscript: May 18, 1987
Published: February 1, 1988

Citation
Susan Houde-Walter and Duncan T. Moore, "Real-time index profile measurement during GRIN glass fabrication," Appl. Opt. 27, 508-515 (1988)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-27-3-508

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