A new instrument for measuring the evolution of index profiles during diffusion in hot (500°C) glass is presented. This instrument, called the oven interferometer, has a spatial resolution of 10 µm at 0.6471 µm and a phase resolution of λ/50. The development of index profiles with both time-dependent and constant boundary conditions is shown.
© 1988 Optical Society of America
Susan Houde-Walter and Duncan T. Moore, "Real-time index profile measurement during GRIN glass fabrication," Appl. Opt. 27, 508-515 (1988)