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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 27, Iss. 3 — Feb. 1, 1988
  • pp: 603–609

Optical contamination measurements on early Shuttle missions

K. Stuart Clifton and Jerry K. Owens  »View Author Affiliations


Applied Optics, Vol. 27, Issue 3, pp. 603-609 (1988)
http://dx.doi.org/10.1364/AO.27.000603


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Abstract

Two camera/photometers were included as part of the Induced Environment Contamination Monitor on STS-2, -3, -4, and -9 orbital missions to record photographically Shuttle-induced particulate and background contamination. The cameras collected stereoscopic data continuously during the on-orbit phases of these missions making exposures every 150 s. The results recorded throughout a 32° field-of-view indicate high particle concentrations during early mission operations. These decay to a quiescent rate of 500 particles of >10-μm radius observed per orbit. Preliminary size and velocity distributions of measured particles are presented as are measurements of background brightness due to unresolved particles in the visible spectral region.

© 1988 Optical Society of America

History
Original Manuscript: June 16, 1987
Published: February 1, 1988

Citation
K. Stuart Clifton and Jerry K. Owens, "Optical contamination measurements on early Shuttle missions," Appl. Opt. 27, 603-609 (1988)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-27-3-603

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