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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 27, Iss. 8 — Apr. 15, 1988
  • pp: 1534–1538

Processing of interferometric fringe scanner data for the AXAF/TMA x-ray telescope

Paul Glenn and Andrea Sarnik  »View Author Affiliations


Applied Optics, Vol. 27, Issue 8, pp. 1534-1538 (1988)
http://dx.doi.org/10.1364/AO.27.001534


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Abstract

An interferometric fringe scanner was used for the Technology Mirror Assembly (TMA) x-ray telescope, built by Perkin-Elmer as a technology demonstration for the Advanced X-Ray Astrophysics Facility (AXAF). We discuss advanced data processing features, implemented during a follow-on project to improve the mirror’s midfrequency errors still further. Data processing techniques include interleaving of multiple scans, and optimal smoothing and interpolation of the interleaved data onto a uniform grid. We discuss the underlying mathematics behind the processes, the motivation in terms of recovering the highest possible spatial frequencies from the data, and some sample results.

© 1988 Optical Society of America

History
Original Manuscript: October 9, 1987
Published: April 15, 1988

Citation
Paul Glenn and Andrea Sarnik, "Processing of interferometric fringe scanner data for the AXAF/TMA x-ray telescope," Appl. Opt. 27, 1534-1538 (1988)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-27-8-1534


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References

  1. A. Slomba, L. Montagnino, “Subaperture Testing for Mid-Frequency Figure Control on Large Aspheric Mirrors,” Proc. Soc. Photo-Opt. Instrum. Eng. 429, 114 (1983).
  2. A. Slomba, R. Babish, P. Glenn, “Mirror Surface Metrology and Polishing for AXAF TMA,” Proc. Soc. Photo-Opt. Instrum. Eng. 597, 40 (1985).
  3. P. Glenn, A. Slomba, “Derivation of Requirements for Surface Quality and Metrology Instrumentation for AXAF TMA,” Proc. Soc. Photo-Opt. Instrum. Eng. 597, 55 (1985).
  4. A. Gelb, Ed., Applied Optimal Estimation (MIT Press, Cambridge, MA, 1974).

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