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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 27, Iss. 8 — Apr. 15, 1988
  • pp: 1558–1563

X-ray and optical profiler analysis of electroformed x-ray optics

Yutaka Matsui, Melville P. Ulmer, and Peter Z. Takacs  »View Author Affiliations


Applied Optics, Vol. 27, Issue 8, pp. 1558-1563 (1988)
http://dx.doi.org/10.1364/AO.27.001558


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Abstract

Electroformed grazing incidence mirrors were tested with x rays and were measured with an optical profiler. Their total effective areas are ≳70% of the theoretical values both for 1.5- and 6.4-keV x rays. The half-power diameters (HPDs) are ≲2 min of arc at 1.5 keV. Comparing the x-ray test result with the optical measurement, we set requirements of high-frequency roughness <14 Å and a midfrequency roughness <70 Å for a HPD < 1.5 min of arc at 7 keV. We also present a design of the mirror array telescope for high energies (MARTHE) which has a total effective area of ~1000 cm2 for 7-keV x rays.

© 1988 Optical Society of America

History
Original Manuscript: August 18, 1987
Published: April 15, 1988

Citation
Yutaka Matsui, Melville P. Ulmer, and Peter Z. Takacs, "X-ray and optical profiler analysis of electroformed x-ray optics," Appl. Opt. 27, 1558-1563 (1988)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-27-8-1558

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