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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 27, Iss. 8 — Apr. 15, 1988
  • pp: 1568–1573

Soft x-ray and extreme ultraviolet quantum detection efficiency of potassium bromide photocathode layers on microchannel plates

Oswald H. W. Siegmund, D. E. Everman, John V. Vallerga, and Michael Lampton  »View Author Affiliations


Applied Optics, Vol. 27, Issue 8, pp. 1568-1573 (1988)
http://dx.doi.org/10.1364/AO.27.001568


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Abstract

The quantum detection efficiency (QDE) of potassium bromide, applied directly to the surface of a microchannel plate (MCP), has been measured over the wavelength range from 44 to 1216 Å. We present the first measurements for the QDE of KBr between 44 and 256 Å. These show that there is a high QDE peak (~70%) centered at ~70 Å. The results at wavelengths above 256 Å agree with our previous study. Investigation of the angular dependence of the QDE indicates that maximum efficiencies are achieved for graze angles ≤10° at wavelengths below 171 Å. Examination of the photocathode surface with a scanning electron microscope shows that the KBr layer is rough, with granularity at the 0.5-μm level.

© 1988 Optical Society of America

History
Original Manuscript: August 24, 1987
Published: April 15, 1988

Citation
Oswald H. W. Siegmund, D. E. Everman, John V. Vallerga, and Michael Lampton, "Soft x-ray and extreme ultraviolet quantum detection efficiency of potassium bromide photocathode layers on microchannel plates," Appl. Opt. 27, 1568-1573 (1988)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-27-8-1568

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