The index grating lifetime in liquid encapsulated Czochralski-grown undoped semi-insulating GaAs was measured using a beam coupling technique. The largest lifetime measured was ~8 s under a read beam intensity of 0.7 mW/cm2 with the grating periodicity being 0.63 µm. The measured value decreases to milliseconds as the read beam intensity and the grating periodicity increase to ~10 mW/cm2 and 4 µm, respectively. This range of grating lifetime in this material is adequate for its use in real-time spatial light modulators, reconfigurable beam steering devices, and dynamic memory elements for optical computing. In addition, the results suggest that, the lifetime is sensitive to residual imperfections in the crystal.
© 1988 Optical Society of America
Li-Jen Cheng and Afshin Partovi, "Index grating lifetime in photorefractive GaAs," Appl. Opt. 27, 1760-1763 (1988)