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Applied Optics

Applied Optics


  • Vol. 27, Iss. 9 — May. 1, 1988
  • pp: 1811–1813

Photothermal deflection technique for measuring thermal nonlinearities in semiconductor glasses

Mario Bertolotti, Aldo Ferrari, Concita Sibilia, Giovenna Suber, Dar Apostol, and Peter Jani  »View Author Affiliations

Applied Optics, Vol. 27, Issue 9, pp. 1811-1813 (1988)

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The photothermal deflection technique is used to determine the thermal nonlinearity in samples of glasses doped with CdSxSe1−x. Values of the nonlinear refractive index are derived at low frequencies; they compare with recently obtained dc values in similar, but not equal, glasses.

© 1988 Optical Society of America

Original Manuscript: July 21, 1987
Published: May 1, 1988

Mario Bertolotti, Aldo Ferrari, Concita Sibilia, Giovenna Suber, Dar Apostol, and Peter Jani, "Photothermal deflection technique for measuring thermal nonlinearities in semiconductor glasses," Appl. Opt. 27, 1811-1813 (1988)

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