The photothermal deflection technique is used to determine the thermal nonlinearity in samples of glasses doped with CdSxSe1−x. Values of the nonlinear refractive index are derived at low frequencies; they compare with recently obtained dc values in similar, but not equal, glasses.
© 1988 Optical Society of America
Original Manuscript: July 21, 1987
Published: May 1, 1988
Mario Bertolotti, Aldo Ferrari, Concita Sibilia, Giovenna Suber, Dar Apostol, and Peter Jani, "Photothermal deflection technique for measuring thermal nonlinearities in semiconductor glasses," Appl. Opt. 27, 1811-1813 (1988)