Photothermal deflection technique for measuring thermal nonlinearities in semiconductor glasses
Applied Optics, Vol. 27, Issue 9, pp. 1811-1813 (1988)
http://dx.doi.org/10.1364/AO.27.001811
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Abstract
The photothermal deflection technique is used to determine the thermal nonlinearity in samples of glasses doped with CdSxSe1-x. Values of the nonlinear refractive index are derived at low frequencies; they compare with recently obtained dc values in similar, but not equal, glasses.
© 1988 Optical Society of America
Citation
Mario Bertolotti, Aldo Ferrari, Concita Sibilia, Giovenna Suber, Dar Apostol, and Peter Jani, "Photothermal deflection technique for measuring thermal nonlinearities in semiconductor glasses," Appl. Opt. 27, 1811-1813 (1988)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-27-9-1811
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