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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 27, Iss. 9 — May. 1, 1988
  • pp: 1811–1813

Photothermal deflection technique for measuring thermal nonlinearities in semiconductor glasses

Mario Bertolotti, Aldo Ferrari, Concita Sibilia, Giovenna Suber, Dar Apostol, and Peter Jani  »View Author Affiliations


Applied Optics, Vol. 27, Issue 9, pp. 1811-1813 (1988)
http://dx.doi.org/10.1364/AO.27.001811


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Abstract

The photothermal deflection technique is used to determine the thermal nonlinearity in samples of glasses doped with CdSxSe1−x. Values of the nonlinear refractive index are derived at low frequencies; they compare with recently obtained dc values in similar, but not equal, glasses.

© 1988 Optical Society of America

History
Original Manuscript: July 21, 1987
Published: May 1, 1988

Citation
Mario Bertolotti, Aldo Ferrari, Concita Sibilia, Giovenna Suber, Dar Apostol, and Peter Jani, "Photothermal deflection technique for measuring thermal nonlinearities in semiconductor glasses," Appl. Opt. 27, 1811-1813 (1988)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-27-9-1811


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References

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  7. S. Patela, H. Jerominek, C. Deliole, R. Tremblay, “Nonlinear Optical Properties of This Film Waveguides Deposited onto Semiconductor Doped Glasses,” J. Appl. Phys. 60, 1591 (1986). [CrossRef]
  8. W. B. Jackson, N. M. Amer, A. C. Boccara, D. Fournier, “Photothermal Deflection Spectroscopy and Detection,” Appl. Opt. 20, 1333 (1981). [CrossRef] [PubMed]
  9. A. C. Boccara, D. Fournier, W. B. Jackson, N. M. Amer, “Sensitive Photothermal Deflection Technique for Measuring Absorption in Optically Thin Media,” Opt. Lett. 5, 377 (1980). [CrossRef] [PubMed]

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