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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 28, Iss. 11 — Jun. 1, 1989
  • pp: 2138–2142

Dayglow photometry: a new approach

R. Narayanan, J. N. Desai, N. K. Modi, R. Raghavarao, and R. Sridharan  »View Author Affiliations


Applied Optics, Vol. 28, Issue 11, pp. 2138-2142 (1989)
http://dx.doi.org/10.1364/AO.28.002138


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Abstract

A unique photometer capable of measuring line intensities of <0.1% of the bright background continuum (5 × 106/Å) has been developed and successfully commissioned for the measurement of daytime OI 630.0-nm emission from the thermosphere. The photometer employs a low resolution (104) Fabry-Perot etalon, temperature tuned narrowband (3-Å) interference filter, radial chopper, and up/down counting system. The optimum choice of the photometer parameters and a unique method of eliminating the background enabled us to overcome the limitations of the earlier attempts to make measurements on such phenomena as dayglow and has opened up a wide range of uses. However, at present, it is being discussed only in the context of dayglow measurements.

© 1989 Optical Society of America

History
Original Manuscript: August 9, 1988
Published: June 1, 1989

Citation
R. Narayanan, J. N. Desai, N. K. Modi, R. Raghavarao, and R. Sridharan, "Dayglow photometry: a new approach," Appl. Opt. 28, 2138-2142 (1989)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-28-11-2138

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