OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 28, Iss. 14 — Jul. 15, 1989
  • pp: 2889–2894

Wideband monitoring and measuring system for optical coatings

Li Li and Yi-hsun Yen  »View Author Affiliations


Applied Optics, Vol. 28, Issue 14, pp. 2889-2894 (1989)
http://dx.doi.org/10.1364/AO.28.002889


View Full Text Article

Enhanced HTML    Acrobat PDF (635 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

A wideband system, controlled by an IBM PC/XT computer, has been established for monitoring and measuring optical coatings in vacuum. With supporting software, it is adaptable to various monitoring methods, which include using merit functions as criteria for terminating deposition, and the simultaneous display of transmittance functions T, ∂T/∂t, and ∂T/∂λ at a particular wavelength. It can also be used in the measurement of optical constants of dielectric layers in vacuum. The design considerations of the system are discussed, and experimental results are given.

© 1989 Optical Society of America

History
Original Manuscript: May 4, 1988
Published: July 15, 1989

Citation
Li Li and Yi-hsun Yen, "Wideband monitoring and measuring system for optical coatings," Appl. Opt. 28, 2889-2894 (1989)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-28-14-2889


Sort:  Author  |  Year  |  Journal  |  Reset  

References

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited