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Applied Optics

Applied Optics


  • Vol. 28, Iss. 14 — Jul. 15, 1989
  • pp: 2911–2913

Determination of optical constants by angle scanning reflectometry

Merritt N. Deeter and Dror Sarid  »View Author Affiliations

Applied Optics, Vol. 28, Issue 14, pp. 2911-2913 (1989)

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Reflectance measurements made on an Fe film over a wide range of angles of incidence are curve-fitted to extract the optical constants n and k. Problems with surface oxide layers are eliminated by making the reflectance measurements through the substrate. The experimental uncertainties of n and k are determined by a rigorous χ2 analysis. The experimentally determined optical constants are found to be considerably larger than values found in the literature.

© 1989 Optical Society of America

Original Manuscript: July 1, 1988
Published: July 15, 1989

Merritt N. Deeter and Dror Sarid, "Determination of optical constants by angle scanning reflectometry," Appl. Opt. 28, 2911-2913 (1989)

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