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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 28, Iss. 14 — Jul. 15, 1989
  • pp: 2911–2913

Determination of optical constants by angle scanning reflectometry

Merritt N. Deeter and Dror Sarid  »View Author Affiliations


Applied Optics, Vol. 28, Issue 14, pp. 2911-2913 (1989)
http://dx.doi.org/10.1364/AO.28.002911


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Abstract

Reflectance measurements made on an Fe film over a wide range of angles of incidence are curve-fitted to extract the optical constants n and k. Problems with surface oxide layers are eliminated by making the reflectance measurements through the substrate. The experimental uncertainties of n and k are determined by a rigorous χ2 analysis. The experimentally determined optical constants are found to be considerably larger than values found in the literature.

© 1989 Optical Society of America

History
Original Manuscript: July 1, 1988
Published: July 15, 1989

Citation
Merritt N. Deeter and Dror Sarid, "Determination of optical constants by angle scanning reflectometry," Appl. Opt. 28, 2911-2913 (1989)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-28-14-2911


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References

  1. D. E. Aspnes, “The Accurate Determination of Optical Properties by Ellipsometry,” in Handbook of Optical Constants of Solids, E. D. Palik, Ed. (Academic, Orlando, FL, 1985), Chap. 5.
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  7. W. H. Press et al., Numerical Recipes, the Art of Scientific Computing (Cambridge U.P., Cambridge, 1986), Chap. 10.
  8. J. Kranz, H. Stremme, “Measurements of the Longitudinal Magnetooptic Kerr Reflection of a Simple Multilayer,” IEEE Trans. Magn. MAG-5, 453–457 (1969). [CrossRef]
  9. J. H. Weaver et al., “Low-Energy Interband Absorption in bcc Fe and hcp Co,” Phys. Rev. B 19, 3850–3856 (1979). [CrossRef]

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