Abstract

Exact theoretical expressions including absorption, multiple reflections, and interference effects are derived for the intensity of Raman scattering from thin films. A concept of interference enhanced Raman scattering is presented based on a two-layer configuration that has been verified experimentally by Raman scattering measurements on thin amorphous hydrogenated carbon films deposited on crystalline Si substrates. It is shown how the model can be generalized to describe the Raman scattering intensity for a sample layer inside a multilayer structure.

© 1989 Optical Society of America

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